TLE4973-R050T5-S0010
新規設計非推奨
RoHS対応
鉛フリー

TLE4973-R050T5-S0010

XENSIV™ TLE4973-R050T5-S0010 high-accuracy coreless current sensor with digital control and diagnostic interface in a TISON package

Content could not be loaded

Unfortunately, we were unable to load the content for this section. You may want to refresh the page or try again later.

TLE4973-R050T5-S0010
TLE4973-R050T5-S0010


製品仕様情報

  • Current rail
    internal (iCR)
  • Currently planned availability until at least
    2039
  • アイソレーションVIORM
    1150 V
  • インターフェース
    Analog
  • 分類
    AEC-Q100, ISO 26262-compliant
  • 環境規制対応
    Halogen free, RoHS compliant
  • 精度
    1.7 %
  • 診断
    diagnosis mode, UV, OV, OCD
  • 電流範囲
    55 A
  • 電源電圧
    4.5 - 5.5 V

OPN
TLE4973R050T5S0010XUMA1
製品ステータス not for new design
インフィニオン パッケージ
パッケージ名 N/A
梱包サイズ 2500
梱包形態 TAPE & REEL
MSL (湿度感受性レベル) 3
防湿梱包 DRY
鉛フリー Yes
ハロゲンフリー Yes
RoHS対応 Yes
組立国
MY
ウェハ製造国
MY

製品ステータス not for new design
インフィニオン パッケージ
パッケージ名 -
梱包サイズ 2500
梱包形態 TAPE & REEL
MSL (湿度感受性レベル) 3
防湿梱包 DRY
鉛フリー
ハロゲンフリー
RoHS準拠
組立国
MY
ウェハ製造国
MY
The Infineon XENSIV™ TLE4973-R050T5-S0010 is a current sensor, pre-programmed to the 55 A measurement range with integrated current rail in 8x 8 mm SMD body. This sensor works at 5 V with up to ±55 A measurement range and provides an analog output with over current detection output. Digital control interface provides temperature readout, safety status readout, read/write programming access to internal EEPROM, and control of diagnosis mode.

特長

  • High accurate coreless sensor
  • 5 V supply voltage
  • Galvanic isolation up to 1150 V
  • Ultra-low ohm internal current rail
  • The ratiometricity function is set on
  • Digital control interface
  • Very fast overcurrent detection
  • Programmable sensitivity
  • Programmable overcurrent threshold
  • ISO 26262-compliant (ASIL B)
  • Single ended analog output

利点

  • No hysteresis, no saturation
  • Robustness against surge voltage
  • Protection against over currents
  • Very low power dissipation
  • Fit for safety critical application
  • Reliable measurement over lifetime

アプリケーション

ドキュメント

設計リソース

開発者コミュニティ