Active and preferred

EVAL_2EDB_HB_GAN

CoolGaN™ GIT HEMT half-bridge evaluation board with EiceDRIVER™ 2EDB8259Y

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EVAL_2EDB_HB_GAN
EVAL_2EDB_HB_GAN

製品詳細

  • Iout
    Depends on the topology and frequency
  • インターフェース
    7-pole position terminal block, 2-pole position terminal block with 5.08mm pitch
  • サブアプリケーション
    Industrial
  • トポロジー
    Half Bridge
  • ファミリー
    High/Low Side Switch
  • 入力タイプ
    DC
  • 出力電圧
    0 V to 450 V
  • 周波数 max
    2000 kHz
  • 実装
    screw driver for cables connection
  • 寸法
    76,7x 74,3 x 1,6
  • 対象アプリケーション
    Server and Telecom switch-mode power supplies (SMPS), EV Off-board chargers, Solar micro inverter, Industrial power supplies (SMPS, Residential UPS)
  • 認定
    Industrial
  • 電源電圧
    0 V to 450 V
OPN
EVAL2EDBHBGANTOBO1
製品ステータス active and preferred
インフィニオンパッケージ --
パッケージ名 N/A
包装サイズ 1
包装形態 CONTAINER
水分レベル N/A
モイスチャーパッキン NON DRY
鉛フリー No
ハロゲンフリー No
RoHS準拠 No
Infineon stock last updated:

製品ステータス
Active
インフィニオンパッケージ --
パッケージ名 -
包装サイズ 1
包装形態 CONTAINER
水分レベル -
モイスチャーパッキン NON DRY
鉛フリー
ハロゲンフリー
RoHS対応
The EVAL_2EDB_HB_GaN facilitates testing of Infineon CoolGaN™ GIT HEMT with EiceDRIVER™ 2EDB8259Y. It supports configuration of the auxiliary supply as bipolar or unipolar, isolated or non-isolated, with or without bootstrap, and is suitable for buck or boost-mode, double-pulse testing, continuous PWM operation, and hard-/soft-switching at high power levels and MHz frequencies, eliminating the need for custom gate driver and power circuit design.

機能

  • Simple GaN half-bridge with dedicated GaN driver ICs
  • Configurable auxiliary supply: unipolar vs. bipolar (with regulation on positive or negative rail), isolated vs non-isolated (bootstrap)
  • Shunt on low-side GaN for current measurement

利点

  • Easy setup and use
  • Enable testing with different configurations (Buck, Boost, Direct and Reverse Double Pulse)
  • Evaluate high-frequency capabilities of GaN
  • Evaluate waveforms with low ringing, overshoot, EMI
  • Enables easy evaluation at multi-kilowatt power levels
  • Shoot-through check and Eoss measurements via current shunt

用途

ドキュメント

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