Rad hard MOSFETs

N-channel and P-channel rad hard MOSFETs certified to ESA and DLA standards

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About

DLA and ESA qualified rad hard power MOSFETs

Infineon is a leader in high-reliability power solutions, with its subsidiary, International Rectifier HiRel Products, Inc. (IR HiRel), being the first manufacturer to offer rad hard power MOSFETs for space in 1987. Over the last three decades, IR HiRel has continuously innovated in silicon design, packaging technology, and quality with US DLA QPL products up to MIL-PRF-19500 JANS level.

Infineon offers a broad selection of N-channel and P-channel rad hard MOSFETs in a wide range of hermetic packaging screened to MIL-PRF-19500 and ESCC-5000, and available as QPLs. Select rad hard MOSFETs are also available as bare die.

DLA quality conformance testing of IR HiRel-branded rad hard MOSFETs

HiRel products, unlike commercial ones, must undergo quality conformance inspection (QCI) testing at various levels to ensure product performance to specifications.

In the United States, the Defense Logistics Agency (DLA) is the controlling agency and has issued specifications that govern the quality conformance testing sequence performed on semiconductor devices and hybrid modules.

MIL-PRF-19500/MIL-STD-750 are the controlling specifications for discrete semiconductors such as diodes and power MOSFETs. MIL-PRF-19500 directs discrete semiconductors to be manufactured to either JAN, JANTX, JANTXV, or JANS levels (Note: the JAN level is not allowed for MOSFETs).

Infineon's IR HiRel-branded rad hard MOSFETs and diodes are available with the following QCI levels:

  • DLA-approved Qualified Product List (QPL) S-level per MIL-PRF-19500. DLA part numbers start with the JAN branded prefix.
  • IR HiRel's Qualified IR List (QIRL) with S-level equivalent to MIL-PRF-19500, manufactured and tested on a DLA approved production line. QIRL part numbers have SCS suffixes. 
  • Source Control Drawing (SCD)
  • Commercial-off-the-shelf (COTS) with no QCI
ESA quality conformance testing of Infineon-branded rad hard MOSFETs

Unlike standard commercial products, high reliability products must be submitted to various levels of quality conformance testing to ensure that the products are capable of performing to specifications in the often-harsh environments of military and space applications. In Europe, the European Space Agency (ESA) is the controlling agency and has issued specifications that govern the quality conformance testing sequence performed on discrete semiconductor components, hermetically sealed and die, namely ESCC-5000.

Infineon's IR HiRel hermetic products are available as (1) commercial hermetic, designated (P) with the same fit, form, and function as the flight parts and without radiation hardness or screening per Chart F3 in ESCC Generic Specification No. 5000, or (2) ESCC-5000 space-qualified for flight use. Such parts are denoted as (ES). Infineon-branded rad hard MOSFETs are also available as qualified bare die.

Radiation hardness assurance of Infineon's rad hard MOSFETs

Infineon’s rad hard MOSFETs are tested to verify their radiation hardness capability, with an assurance program based on the requirements outlined in ESCC-5000, MIL-PRF-19500, and associated slash sheets. Our IR HiRel-branded products exceed the standard requirements with a sampling size up to two times greater than is required for every manufacturing lot. Both pre- and post-irradiation performance are tested and specified using the same drive circuitry and test conditions to provide a direct comparison.

Radiation harden-by-design techniques virtually eliminate the possibility of single-event gate rupture (SEGR) and single-event burnout (SEB) in the rad hard power MOSFETs. Robust performance is then verified through extensive single-event effects testing.

Glossary of DLA MIL-STD classifications and screening levels

Class H: Class H is the standard military quality level provided in MIL-PRF-38534, General Specification for Hybrid Microcircuits. It is intended for space applications.

Level B: Class level B defines the screening requirements for high-reliability military applications as specified in MIL-STD-883 and is intended for use in class H products.

Level S: Class level S defines the screening requirements for high-reliability space applications as specified in MIL-STD-883 and is intended for use in class K products.

JAN: JAN (Joint Army Navy) is the prefix assigned by the DLA to designate devices on the DLA-qualified parts list.

JANTX: Military screening level as specified in MIL-PRF-19500 for a DLA-qualified device.

JANTXV: Military with visual inspection screening level as specified in MIL-PRF-19500 for a DLA-qualified device.

JANS: Space level screening as specified in MIL-PRF-19500 for a DLA-qualified device.

High reliability packaging information

Learn more about Infineon’s rad hard and HiRel MOSFET portfolios’ package details, including package outline drawings, weights and more.  

Learn more about HiRel's packaging information

DLA and ESA qualified rad hard power MOSFETs

Infineon is a leader in high-reliability power solutions, with its subsidiary, International Rectifier HiRel Products, Inc. (IR HiRel), being the first manufacturer to offer rad hard power MOSFETs for space in 1987. Over the last three decades, IR HiRel has continuously innovated in silicon design, packaging technology, and quality with US DLA QPL products up to MIL-PRF-19500 JANS level.

Infineon offers a broad selection of N-channel and P-channel rad hard MOSFETs in a wide range of hermetic packaging screened to MIL-PRF-19500 and ESCC-5000, and available as QPLs. Select rad hard MOSFETs are also available as bare die.

DLA quality conformance testing of IR HiRel-branded rad hard MOSFETs

HiRel products, unlike commercial ones, must undergo quality conformance inspection (QCI) testing at various levels to ensure product performance to specifications.

In the United States, the Defense Logistics Agency (DLA) is the controlling agency and has issued specifications that govern the quality conformance testing sequence performed on semiconductor devices and hybrid modules.

MIL-PRF-19500/MIL-STD-750 are the controlling specifications for discrete semiconductors such as diodes and power MOSFETs. MIL-PRF-19500 directs discrete semiconductors to be manufactured to either JAN, JANTX, JANTXV, or JANS levels (Note: the JAN level is not allowed for MOSFETs).

Infineon's IR HiRel-branded rad hard MOSFETs and diodes are available with the following QCI levels:

  • DLA-approved Qualified Product List (QPL) S-level per MIL-PRF-19500. DLA part numbers start with the JAN branded prefix.
  • IR HiRel's Qualified IR List (QIRL) with S-level equivalent to MIL-PRF-19500, manufactured and tested on a DLA approved production line. QIRL part numbers have SCS suffixes. 
  • Source Control Drawing (SCD)
  • Commercial-off-the-shelf (COTS) with no QCI

ESA quality conformance testing of Infineon-branded rad hard MOSFETs

Unlike standard commercial products, high reliability products must be submitted to various levels of quality conformance testing to ensure that the products are capable of performing to specifications in the often-harsh environments of military and space applications. In Europe, the European Space Agency (ESA) is the controlling agency and has issued specifications that govern the quality conformance testing sequence performed on discrete semiconductor components, hermetically sealed and die, namely ESCC-5000.

Infineon's IR HiRel hermetic products are available as (1) commercial hermetic, designated (P) with the same fit, form, and function as the flight parts and without radiation hardness or screening per Chart F3 in ESCC Generic Specification No. 5000, or (2) ESCC-5000 space-qualified for flight use. Such parts are denoted as (ES). Infineon-branded rad hard MOSFETs are also available as qualified bare die.

Radiation hardness assurance of Infineon's rad hard MOSFETs

Infineon’s rad hard MOSFETs are tested to verify their radiation hardness capability, with an assurance program based on the requirements outlined in ESCC-5000, MIL-PRF-19500, and associated slash sheets. Our IR HiRel-branded products exceed the standard requirements with a sampling size up to two times greater than is required for every manufacturing lot. Both pre- and post-irradiation performance are tested and specified using the same drive circuitry and test conditions to provide a direct comparison.

Radiation harden-by-design techniques virtually eliminate the possibility of single-event gate rupture (SEGR) and single-event burnout (SEB) in the rad hard power MOSFETs. Robust performance is then verified through extensive single-event effects testing.

Glossary of DLA MIL-STD classifications and screening levels

Class H: Class H is the standard military quality level provided in MIL-PRF-38534, General Specification for Hybrid Microcircuits. It is intended for space applications.

Level B: Class level B defines the screening requirements for high-reliability military applications as specified in MIL-STD-883 and is intended for use in class H products.

Level S: Class level S defines the screening requirements for high-reliability space applications as specified in MIL-STD-883 and is intended for use in class K products.

JAN: JAN (Joint Army Navy) is the prefix assigned by the DLA to designate devices on the DLA-qualified parts list.

JANTX: Military screening level as specified in MIL-PRF-19500 for a DLA-qualified device.

JANTXV: Military with visual inspection screening level as specified in MIL-PRF-19500 for a DLA-qualified device.

JANS: Space level screening as specified in MIL-PRF-19500 for a DLA-qualified device.

High reliability packaging information

Learn more about Infineon’s rad hard and HiRel MOSFET portfolios’ package details, including package outline drawings, weights and more.  

Learn more about HiRel's packaging information

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