Failure analysis

Failure analysis network

Failure analysis (FA) finds the root cause of any malfunction of our products and helps to improve reliability and yield throughout the entire product lifecycle.

A global network of Failure Analysis laboratories and experts supports analysis requests world wide. This network tailors the analysis support to your individual case requirements – no matter to which location the request was submitted.
Failure analysis network

Starting with the first project idea and prototype, Infineons‘s global FA organization accompanies a product throughout its entire lifecycle. Thanks to early engagement in product development, the FA laboratories are well prepared with a variety of cutting-edge FA methods and tools, as well as comprehensive knowledge on the product properties and history.
Analysis flow

The analysis flow is tailored to the individual case: Starting with electrical verification, non-destructive analysis techniques involving optical and X-ray inspection are combined with detailed failure localization, preparation and visualization. To pin-point and understand the failure mechanism, sophisticated methods and tools enable analysis down to the nanometer scale, employing transistor-level nanoprobing or even atomic-resolution imaging with Transmission Electron Microscopy (TEM). This flow is optimized by KI-based data analysis and continuous method development for fast and high quality analysis results.