Please note that this is an end of life product. See newer alternative product version Please note that this is an end of life product. See newer alternative product version
END OF LIFE
discontinued
RoHS Compliant

S29GL032N90TFI030

END OF LIFE
Data Sheet
package
software

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S29GL032N90TFI030
S29GL032N90TFI030
Data Sheet

Product details

  • Density
    32 MBit
  • Family
    GL-N
  • Initial Access Time
    90 ns
  • Interface Frequency (SDR/DDR) (MHz)
    NA
  • Interfaces
    Parallel
  • Lead Ball Finish
    Matte Tin Plating
  • Operating Temperature
    -40 °C to 85 °C
  • Operating Voltage
    3 V
  • Page Access Time
    25 ns
  • Peak Reflow Temp
    260 °C
OPN
S29GL032N90TFI030
Product Status discontinued
Infineon Package
PG-TSOP-48
Package Name TSOP-48 (51-85183)
Packing Size 960
Packing Type TRAY
Moisture Level N/A
Moisture Packing DRY
Lead-free No
Halogen Free No
RoHS Compliant Yes
Infineon stock last updated:

Product Status discontinued
Infineon Package
PG-TSOP-48
Package Name TSOP-48 (51-85183)
Packing Size 960
Packing Type TRAY
Moisture Level -
Moisture Packing DRY
Lead Free
Halogen Free
RoHS Compliant
The S29GL032N90TFI030 is a 32 Mbit (4 MB) 3.0 V page-mode Flash memory based on 110 nm MirrorBit technology, supporting 16-bit or 8-bit data bus operation and 90 ns access time. It operates with VCC from 2.7 V to 3.6 V and VIO from 1.65 V to 3.6 V, over an industrial temperature range of -40°C to +85°C.

Features

  • 3 V single power supply operation
  • 16-bit data bus, byte/word selectable
  • 8-word/16-byte page read buffer
  • 16-word/32-byte write buffer
  • Unlock Bypass mode for fast programming
  • Accelerated program via WP#/ACC pin
  • Advanced sector protection:
  • Secured Silicon Sector for code/data
  • 100,000 erase cycles per sector
  • 20-year data retention
  • Low power: 1 µA standby, 1 mA page read
  • JEDEC and CFI command set compatible

Benefits

  • Simplifies power design with single 3 V
  • Flexible interface for 8/16-bit systems
  • Fast random access with page read buffer
  • Quick multi-word updates reduce downtime
  • Faster programming boosts throughput
  • High security for code/data storage
  • Multiple protection modes prevent data loss
  • Reliable with high endurance and retention
  • Low power extends battery/system life
  • Easy integration with JEDEC, CFI standards

Applications

Documents

Documents

Design resources

Partner solutions

Developer community

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