CY7C1041G-10ZSXI
Active and preferred
RoHS Compliant
Lead-free

CY7C1041G-10ZSXI

ea.
in stock

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CY7C1041G-10ZSXI
CY7C1041G-10ZSXI
ea.

Product details

  • Density
    4 MBit
  • Family
    FAST SRAM
  • Interfaces
    Parallel
  • Lead Ball Finish
    Ni/Pd/Au
  • Operating Temperature range
    -40 °C to 85 °C
  • Operating Voltage (VCCQ) range
    4.5 V to 5.5 V
  • Operating Voltage range
    4.5 V to 5.5 V
  • Organization (X x Y)
    256K x 16
  • Peak Reflow Temp
    260 °C
  • Planned to be available until at least
    2033
  • Qualification
    Industrial
  • Speed
    10 ns
OPN
CY7C1041G-10ZSXI
Product Status active and preferred
Infineon Package
Package Name TSOP-II-44 (51-85087)
Packing Size 675
Packing Type TRAY
Moisture Level 3
Moisture Packing DRY
Lead-free Yes
Halogen Free Yes
RoHS Compliant Yes
Infineon stock last updated:
ea. in stock

Product Status
Active
Infineon Package
Package Name TSOP-II-44 (51-85087)
Packing Size 675
Packing Type TRAY
Moisture Level 3
Moisture Packing DRY
Lead Free
Halogen Free
RoHS Compliant
ea.
in stock
CY7C1041G-10ZSXI is a 4-Mbit (256K × 16) asynchronous CMOS SRAM with embedded ECC for single-bit error correction. This 10 ns, 4.5 V to 5.5 V industrial (-40 to 85°C) device supports byte reads/writes via BLE/BHE and uses CE/OE/WE control. It is offered in a Pb-free 44-pin TSOP II package, and specifies ICC 45 mA max at 100 MHz, ISB2 8 mA max power-down, and TTL-compatible I/O levels.

Features

  • 4-Mbit SRAM (256K × 16)
  • Embedded ECC single-bit correct
  • ERR pin flags corrected read errors
  • Address access time tAA 10 ns/15 ns
  • Read cycle time tRC 10 ns/15 ns
  • OE to data valid tDOE 4.5 ns max
  • Byte write/read via BHE and BLE
  • Automatic CE power-down mode
  • Data retention down to 1.0 V
  • Industrial temp -40°C to +85°C
  • TTL-compatible inputs and outputs

Benefits

  • ECC improves data integrity in SRAM
  • ERR pin enables fault monitoring
  • 10 ns access supports fast CPU buses
  • Fast tDOE reduces read latency
  • Byte enables cut bandwidth and power
  • CE power-down lowers idle current
  • 1.0 V retention keeps backup data
  • Wide temp range boosts reliability
  • TTL I/O simplifies logic interfacing
Documents

Design resources

Developer community

{ "ctalist":[ { "link" : "https://community.infineon.com/t5/forums/postpage/choose-node/true", "label" : "Ask the community", "labelEn" : "Ask the community" }, { "link" : "https://community.infineon.com/t5/Forums/ct-p/products", "label" : "View all discussions", "labelEn" : "View all discussions" } ] }