S25HS02GTFABHV153
Active and preferred
RoHS Compliant
Lead-free

S25HS02GTFABHV153

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S25HS02GTFABHV153
S25HS02GTFABHV153

Product details

  • Density
    2 GBit
  • Family
    HS-T
  • Interface Bandwidth
    102 MByte/s
  • Interface Frequency (SDR/DDR) (MHz)
    166 / 102
  • Interfaces
    Quad SPI
  • Lead Ball Finish
    Sn/Ag/Cu
  • Operating Temperature range
    -40 °C to 105 °C
  • Operating Voltage range
    1.7 V to 2 V
  • Operating Voltage
    1.8 V
  • Peak Reflow Temp
    260 °C
  • Planned to be available until at least
    2037
  • Publish in NPSG
    N
  • Publish in PSG
    N
  • Qualification
    Industrial
OPN
S25HS02GTFABHV153
Product Status active and preferred
Infineon Package
Package Name FBGA-24 (002-24801)
Packing Size 2000
Packing Type TAPE & REEL
Moisture Level 3
Moisture Packing DRY
Lead-free Yes
Halogen Free Yes
RoHS Compliant Yes
Infineon stock last updated:

Product Status
Active
Infineon Package
Package Name FBGA-24 (002-24801)
Packing Size 2000
Packing Type TAPE & REEL
Moisture Level 3
Moisture Packing DRY
Lead Free
Halogen Free
RoHS Compliant
S25HS02GTFABHV153 is a 2.0 Gbit SEMPER™ NOR flash in the HS-T family for code and data storage over Quad SPI. It runs from 1.7 V to 2.0 V across -40°C to 105°C and supports 166 MHz SDR or 102 MHz DDR reads up to 102 MByte/s. Safety and integrity features include ECC SECDED, array CRC, SafeBoot, advanced sector protection, and Endurance flex wear leveling, with SFDP-based discoverability.

Features

  • 45-nm MIRRORBIT™ 2 bits per cell
  • Multi-chip package: 2 × 1 Gb dies
  • Uniform or hybrid sector architecture
  • 256 or 512-byte program buffer
  • 1024-byte OTP secure silicon (SSR)
  • Quad SPI: 1-1-4, 1-4-4, 4-4-4
  • Quad SPI DDR read up to 102 MBps
  • ECC on 16-byte units, Hamming code
  • Corrects 1-bit, detects 2-bit errors
  • ECC status, trap address, counter
  • Endurance flex wear leveling regions
  • LBP + ASP sector/block protection

Benefits

  • Higher density lowers PCB footprint
  • Higher capacity in one BOM item
  • Aligns small params + bulk storage
  • Faster program cuts update time
  • Protect keys/IDs from cloning
  • Flexible host interface compatibility
  • Faster boot and code execute in place
  • ECC boosts read data reliability
  • Detects corruption before failure
  • Speeds debug and field diagnostics
  • Wear leveling extends flash lifetime
  • Prevents accidental erase or writes
Documents

Design resources

Developer community