MIL-PRF-19500

 Screening and Quality Conformance Inspection Requirements

MIL-PRF-19500* covers screening requirements that all parts are submitted to as well as Quality Conformance inspection consisting of one or more of Group A, B, C, D and E for acceptance of the design of the process and of the production lot.

MIL-PRF-19500 applies to discrete components such as MOSFETs and Schottkys. QPL discrete components have been qualified per MIL-PRF-19500.

For more information on MIL-PRF-19500 screening and quality conformance inspection, consult the DoD document or contact factory.

*Beryllia warning per MIL-PRF-19500

Packages TO-254, TO-257, TO-258, TO-259 contain beryllium oxide (beryllia). Devices containing BeO are marked with designation “BeO” as per MIL-PRF-19500.

MIL-PRF-19500 Screening Requirements

Note (1): An IR HiRel approved and certified alternate flow may be applied instead of 100% screen

MIL-PRF-19500 Quality Conformance Inspection

MIL-PRF-19500 Group A Inspection Electrical Verification

MIL-PRF-19500 Group B Inspection Mechanical Verification (JANS)

*Note: Not applicable for Schottky's

MIL-PRF-19500 Group B Inspection Mechanical Verification (JANTX, JANTXV)

*Note: Not applicable for power MOSFETs

MIL-PRF-19500 Group C Inspection Long-term Reliability Verification, Periodic, Each Package Type

MIL-PRF-19500 Group D Inspection Radiation Hardness Assurance Program

1. For device types ≥ 4,000 die per wafer
2. For device types > 500 and < 4,000 die per wafer
3. For device types ≤ 500 die per wafer

MIL-PRF-19500 Group E Inspection Product Qualification

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