XHP™ 2 CoolSiC™ MOSFET 3.3 kV with .XT interconnection technology were especially developed for applications that require high power and high reliability, such as energy storage systems, hydrogen electrolysis, photovoltaic, traction and more.

  • CoolSiC™ MOSFET 3.3 kV
  • XHP™ 2 housing
  • .XT interconnection technology
  • Integrated body diode
  • RDS(on): 1.9, 2.5, 3.8 mOhm
  • Inom: 1000, 750, 500 A

Products

3.3 kV fast - switching, energy - efficient Silicon Carbide CoolSiC™ MOSFETs in low-inductive XHP™ 2 housing with half-bridge topology and robust .XT interconnection technology for enhanced lifetime are available in different variants, with Rdson from 1.9 to 3.8 mΩ and Inom from 1000 A to 500 A.

CoolSiC™ MOSFET modules allow high operating temperatures and switching frequencies, thereby improving overall system efficiency. These modules are available in various configurations, including 3-level, half-bridge, fourpack, sixpack, and booster topologies and come in 1200 V, 2000 V and 3300 V.

 Additional options like pre-applied Thermal Interface Material (TIM) can be ordered as well.

Infineon's CoolSiC™ MOSFET modules are based on trench technology and feature superior gate-oxide reliability , best-on-class switching and conduction losses.

3.3 kV fast - switching, energy - efficient Silicon Carbide CoolSiC™ MOSFETs in low-inductive XHP™ 2 housing with half-bridge topology and robust .XT interconnection technology for enhanced lifetime are available in different variants, with Rdson from 1.9 to 3.8 mΩ and Inom from 1000 A to 500 A.

CoolSiC™ MOSFET modules allow high operating temperatures and switching frequencies, thereby improving overall system efficiency. These modules are available in various configurations, including 3-level, half-bridge, fourpack, sixpack, and booster topologies and come in 1200 V, 2000 V and 3300 V.

 Additional options like pre-applied Thermal Interface Material (TIM) can be ordered as well.

Infineon's CoolSiC™ MOSFET modules are based on trench technology and feature superior gate-oxide reliability , best-on-class switching and conduction losses.

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