Active and preferred
RoHS Compliant
Lead-free

S25HS02GTDPBHV050

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S25HS02GTDPBHV050
S25HS02GTDPBHV050

Product details

  • Classification
    No Certification
  • Density
    2048 MBit
  • Family
    HS-T
  • Interface Frequency (SDR/DDR) (MHz)
    133 / 66
  • Interfaces
    Quad SPI
  • Lead Ball Finish
    Sn/Ag/Cu
  • Operating Temperature range
    -40 °C to 105 °C
  • Operating Voltage range
    1.7 V to 2 V
  • Operating Voltage
    1.8 V
  • Peak Reflow Temp
    260 °C
  • Planned to be available until at least
    2037
  • Qualification
    Industrial
OPN
S25HS02GTDPBHV050
Product Status active and preferred
Infineon Package
Package Name FBGA-24 (002-24801)
Packing Size 520
Packing Type TRAY
Moisture Level 3
Moisture Packing DRY
Lead-free Yes
Halogen Free Yes
RoHS Compliant Yes
Infineon stock last updated:

Product Status
Active
Infineon Package
Package Name FBGA-24 (002-24801)
Packing Size 520
Packing Type TRAY
Moisture Level 3
Moisture Packing DRY
Lead Free
Halogen Free
RoHS Compliant
The S25HS02GTDPBHV050 is a 2 Gb (2048 Mbit) SEMPER™ NOR flash in a 24-ball BGA (halogen-free, Pb-free) MCP with Quad SPI. It operates from 1.7 V to 2.0 V across -40 to 105°C (Industrial Plus). The DP speed option supports 133 MHz SDR and 66 MHz DDR. Safety and integrity include SECDED ECC, array CRC, SafeBoot, and advanced sector protection for code and data storage in embedded systems.

Features

  • 45-nm MIRRORBIT™ 2 bits per cell
  • Multi-chip package: 2 × 1 Gb dies
  • Uniform or hybrid sector architecture
  • 256 or 512-byte program buffer
  • 1024-byte OTP secure silicon (SSR)
  • Quad SPI: 1-1-4, 1-4-4, 4-4-4
  • Quad SPI DDR read up to 102 MBps
  • ECC on 16-byte units, Hamming code
  • Corrects 1-bit, detects 2-bit errors
  • ECC status, trap address, counter
  • Endurance flex wear leveling regions
  • LBP + ASP sector/block protection

Benefits

  • Higher density lowers PCB footprint
  • Higher capacity in one BOM item
  • Aligns small params + bulk storage
  • Faster program cuts update time
  • Protect keys/IDs from cloning
  • Flexible host interface compatibility
  • Faster boot and code execute in place
  • ECC boosts read data reliability
  • Detects corruption before failure
  • Speeds debug and field diagnostics
  • Wear leveling extends flash lifetime
  • Prevents accidental erase or writes

Applications

Documents

Design resources

Developer community

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