Active and preferred
RoHS Compliant
Lead-free

S25HL02GTFABHV150

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S25HL02GTFABHV150
S25HL02GTFABHV150

Product details

  • Classification
    No Certification
  • Density
    2048 MBit
  • Family
    HL-T
  • Interface Frequency (SDR/DDR) (MHz)
    166 / 102
  • Interfaces
    Quad SPI
  • Lead Ball Finish
    Sn/Ag/Cu
  • Operating Temperature range
    -40 °C to 105 °C
  • Operating Voltage range
    2.7 V to 3.6 V
  • Operating Voltage
    3 V
  • Peak Reflow Temp
    260 °C
  • Planned to be available until at least
    2037
  • Qualification
    Industrial
OPN
S25HL02GTFABHV150
Product Status active and preferred
Infineon Package
Package Name FBGA-24 (002-24801)
Packing Size 1300
Packing Type TRAY
Moisture Level 3
Moisture Packing DRY
Lead-free Yes
Halogen Free Yes
RoHS Compliant Yes
Infineon stock last updated:

Product Status
Active
Infineon Package
Package Name FBGA-24 (002-24801)
Packing Size 1300
Packing Type TRAY
Moisture Level 3
Moisture Packing DRY
Lead Free
Halogen Free
RoHS Compliant
The S25HL02GTFABHV150 is a 2 Gb (2048 Mbit) SEMPER™ NOR flash in the HL-T family for code and data storage in industrial systems. It uses Quad SPI with 166 MHz SDR or 102 MHz DDR operation and supports SPI/Dual/Quad protocols including QPI. The device operates from 2.7 V to 3.6 V across -40°C to 105°C, and integrates SECDED ECC, data integrity CRC, SafeBoot, and endurance flex partitions.

Features

  • 45-nm MIRRORBIT™ 2 bits per cell
  • Multi-chip package: 2 × 1 Gb dies
  • Uniform or hybrid sector architecture
  • 256 or 512-byte program buffer
  • 1024-byte OTP secure silicon (SSR)
  • Quad SPI: 1-1-4, 1-4-4, 4-4-4
  • Quad SPI DDR read up to 102 MBps
  • ECC on 16-byte units, Hamming code
  • Corrects 1-bit, detects 2-bit errors
  • ECC status, trap address, counter
  • Endurance flex wear leveling regions
  • LBP + ASP sector/block protection

Benefits

  • Higher density lowers PCB footprint
  • Higher capacity in one BOM item
  • Aligns small params + bulk storage
  • Faster program cuts update time
  • Protect keys/IDs from cloning
  • Flexible host interface compatibility
  • Faster boot and code execute in place
  • ECC boosts read data reliability
  • Detects corruption before failure
  • Speeds debug and field diagnostics
  • Wear leveling extends flash lifetime
  • Prevents accidental erase or writes

Applications

Documents

Design resources

Developer community

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