IR HiRel offers enhanced radiation hardened MOSFET family for mission-critical applications in space

Dec 21, 2016 | Market News

Munich, Germany, and El Segundo, USA – December 21, 2016 – IR HiRel, an Infineon Technologies AG (FSE: IFX / OTCQX: IFNNY) company, has launched its first radiation hardened MOSFETs based on the proprietary N-channel R9 technology platform. Compared to previous technologies it is offering size, weight and power improvements. This is significant in systems such as high-throughput satellites, where the cost-per-bit-ratio can be significantly reduced. The 100 V, 35 A MOSFETs are ideally suited to mission-critical applications requiring an operating life up to and beyond 15 years. Target applications include space-grade DC-DC converters, intermediate bus converters, motor controllers and other high speed switching designs.

Developed by the Infineon IR HiRel business, the IRHNJ9A7130 and IRHNJ9A3130 are fully characterized for TID (total ionizing dose) immunity to radiation of 100 kRads and 300 kRads respectively. An R DS(on) of 25 mΩ (typical) is 33 percent lower than the previous device generation. In combination with increased drain current capability (35 A vs. 22 A), this allows the MOSFETs to provide increased power density and reduced power losses in switching applications.

The MOSFETs have improved Single Event Effect (SEE) immunity and have been characterized for useful performance with Linear Energy Transfer (LET) up to 90 MeV/(mg/cm²); at least 10 percent higher than previous generations. Both of the new devices are packaged in a hermetically sealed, lightweight, surface mount ceramic package (SMD-0.5) measuring just 10.28 mm x 7.64 mm x 3.12 mm. They are also available in bare die form.

Availability

Samples and production quantities of both the IRHNJ9A7130 and IRHNJ9A3130 are available. More information is available at www.infineon.com/R9-space-grade-MOSFET.

Information Number

INFIHR201612-022

Press Photos

  • The IRHNJ9A7130 and IRHNJ9A3130 are fully characterized for TID (total ionizing dose) immunity to radiation of 100 kRads and 300 kRads respectively. An RDS(on) of 25 mΩ (typical) is 33 percent lower than the previous device generation. In combination with increased drain current capability (35 A vs. 22 A), this allows the MOSFETs to provide increased power density and reduced power losses in switching applications.
    The IRHNJ9A7130 and IRHNJ9A3130 are fully characterized for TID (total ionizing dose) immunity to radiation of 100 kRads and 300 kRads respectively. An RDS(on) of 25 mΩ (typical) is 33 percent lower than the previous device generation. In combination with increased drain current capability (35 A vs. 22 A), this allows the MOSFETs to provide increased power density and reduced power losses in switching applications.
    RAD-hard-MOSFET-01

    JPG | 451 kb | 1535 x 1372 px

  • The IRHNJ9A7130 and IRHNJ9A3130 are fully characterized for TID (total ionizing dose) immunity to radiation of 100 kRads and 300 kRads respectively. An RDS(on) of 25 mΩ (typical) is 33 percent lower than the previous device generation. In combination with increased drain current capability (35 A vs. 22 A), this allows the MOSFETs to provide increased power density and reduced power losses in switching applications.
    The IRHNJ9A7130 and IRHNJ9A3130 are fully characterized for TID (total ionizing dose) immunity to radiation of 100 kRads and 300 kRads respectively. An RDS(on) of 25 mΩ (typical) is 33 percent lower than the previous device generation. In combination with increased drain current capability (35 A vs. 22 A), this allows the MOSFETs to provide increased power density and reduced power losses in switching applications.
    RAD-hard-MOSFET-02

    JPG | 104 kb | 904 x 612 px