Rad hard power ICs
Infineon IR HiRel's rad hard power IC solutions are engineered to complement our industry-leading rad hard MOSFET portfolio. The rad hard high-side and low-side MOSFET gate drivers are rated at 100 krad(Si) for total ionizing dose (TID) and have been characterized for single event effects (SEE).
These gate drivers feature a wide operating supply range up to 20 V, low propagation delay and high drive currents. Increase power system reliability and reduce solution size and weight by replacing bulky magnetic or opto-coupler based gate driver designs with IR HiRel’s space-grade gate drivers
Unlike standard commercial products, HiRel products must be submitted to various levels of quality conformance testing to ensure that the products are capable of performing to specifications in the often harsh environments of military and space applications. Both the United States and European community have each developed specifications that detail the sequence of quality conformance testing.
In the United States, the Defense Logistics Agency (DLA) is the controlling agency and has issued specifications that govern the quality conformance testing sequence performed on semiconductor devices and hybrid modules, namely MIL-PRF-19500/MIL-STD-750, MIL-PRF-38534/MIL-STD-883 and MIL-PRF-38535/MIL-STD-883.
MIL-PRF-38535/MIL-STD-883 are the controlling specifications for integrated circuit semiconductors, voltage regulators, operational amplifiers, DC-DC converters and filters. MIL-STD-883 directs these products to be manufactured to class level B or class level S.
International Rectifier HiRel Products Group manufactures and tests hermetic products to one of three distinct quality conformance levels: (1) commercial hermetic, (2) source control drawing (SCD), or (3) MIL-PRF-38534, MIL-PRF-38535 qualified.
Screening and Quality Conformance Inspection Requirements
Class H: Class H is the standard military quality level provided in MIL-PRF-38534, General Specification for Hybrid Microcircuits. It is intended for space applications.
Level B: Class level B defines the screening requirements for high reliability military applications as specified in MIL-STD-883 and is intended for use in class H products.
Level S: Class level S defines the screening requirements for high reliability space applications as specified in MIL-STD-883 and is intended for use in class K products.
JAN: JAN (Joint Army Navy) is the prefix assigned by the DLA to designate devices on the DLA qualified parts list.
JANTX: Military screening level as specified in MIL-PRF-19500 for a DLA qualified device.
JANTXV: Military with visual inspection screening level as specified in MIL-PRF-19500 for a DLA qualified device.
JANS: Space level screening as specified in MIL-PRF-19500 for a DLA qualified device.
