IGBT Modules - Technologies, Driver and Application (Second Edition) - page 502

Fig. 14.2
Overviewof failuremechanisms of IGBTpower semiconductors
14.3 Accelerationmodels
To ensure the reliability of components in their subsequent application, the
manufacturers have to carry out test and qualification measures. Requirements for
power devices in terms of their longevity in the target application are in the range of a
few years up to 30 years for traction applications. Evidence that the components are
suitable for the applicationswould normally take as long as the lifetime of the application
itself. This is obviously not a practical way of proof. Therefore, tests are carried out at a
higher stress but less testing time, which means that the tests are accelerated. The
parameter AF is theacceleration factor for the test.
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